HDRF-3579-J

Features of HDRF-3579-J

• Designed and Developed for WLAN , Wireless device testing 
• Specially Designed for V-T Testing with Temperature Chamber or Environmental Test Chamber
• Ideal for 802.11a, b, g, n, ac, ax,be
• Bluetooth, RFID, 3G, 5G Device testing
• Wide range of I/O connector options.
• Thick RF absorbing foam deadens standing waves and reflections.
• Higher Level Isolation up-to 12GHz for accurate performance.
• Equipped with shielded power filters for power connection in the box while still blocking all wireless signals.
• Rugged construction for long life
• Fully portable design equipped with caster wheels for ease of movement.
• Customized Size to suit application specific requirements ,ideal for test platforms.
• Vertically Stackable upto 3 Units.
• RF Isolation: -       ≥ 130 dB @ 20 MHz ~ 1 GHz
                                     ≥ 120 dB @ 3 GHz 
                                     ≥ 120 dB @ 5 GHz 
                                     ≥ 115 dB @ 6 GHz 
                                     ≥ 110 dB @ 7 GHz 
                                     ≥ 110 dB @ 8 GHz
                                     ≥100 db @ 12 GHz